Scanning probe microscopy

The Heath lab is equipped with an Oxford Instruments Cypher S Scanning Probe Microscope. In addition to standard imaging modes, we frequently collect maps of current (C-AFM a.k.a. ORCA imaging mode, as well as fast current mapping mode), and maps of surface potential (AM-KPFM and FM-KPFM modes). While those are most commonly used modes by our lab, the microscope can also be used to map piezoelectric force, magnetic force, mechanical properties, and other surface characteristics.

We encourage students or faculty who are interested in the microscope to reach out, and chat with us about your ideas. It’s fun to look at new kinds of samples and find out what is possible. We are happy to collect an initial image or two with you, or you can complete our AFM training and be certified to operate the microscope yourself.

Two students adjusting the Oxford Instruments Cypher S Scanning Probe Microscope

Two students viewing the output of the Oxford Instruments Cypher S Scanning Probe Microscope

Topography of a gold nanoparticle cluster in PEDOT:PSS (Amelia Schaeffer)

Conductive AFM image showing variations in current flow through gold nanoparticles in PEDOT:PSS (Amelia Schaeffer)

Surface work function of a 2D field effect transistor measured with Kelvin Probe Force microscopy (Jennifer Heath)

E. Foecalis cells grown in Gel and grown in Broth (Sam Hawkins, Linfield University)

Domain structure of PEDOT:PSS is visible in topography (top) and phase (bottom). Variations in phase are related to different mechanical properties of PEDOT and PSS. (Amelia Schaeffer)